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2024
P. Paramonov, Francken, N., Renders, J., Iuso, D., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., “CAD-ASTRA: A versatile and efficient mesh projector for X-ray tomography with the ASTRA-toolbox”, Optics Express, vol. 32, no. 3, pp. 3425-3439, 2024.PDF icon Download paper (11.29 MB)
D. Gökbel Keklikoğlu, Francken, N., Huyge, B., Merdan, Z., De Beenhouwer, J., and Sijbers, J., “Dynamic flat field correction in edge illumination imaging”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
N. Francken, Sanctorum, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox”, Optics Express, vol. 32, no. 6, pp. 10005-10021, 2024.
N. Francken, De Beenhouwer, J., and Sijbers, J., “Inline edge illumination through sample mask misalignment: a proof of concept”, in Proceedings of the 6th International Conference on X-ray and Neutron Phase Imaging with Gratings, Shenzhen, China, 2024.PDF icon inline_edge_misalign_xnpig.pdf (209.25 KB)
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., “Inline edge illumination X-ray phase contrast imaging through mask misalignment”, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
P. - J. Vanthienen, Francken, N., Sijbers, J., and De Beenhouwer, J., “Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study”, in Developments in X-Ray Tomography XV, 2024, vol. 13152, p. 1315208.
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., “Simulating Atom Probe Tomography Using MFEM”, MFEM Community Workshop. 2024.
2023
N. Francken, Sanctorum, J., Renders, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “A condensed history approach to x-ray dark field effects in edge illumination phase contrast simulations”, in 45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2023.PDF icon Download paper (4.14 MB)
M. Yosifov, Weinberger, P., Reiter, M., Fröhler, B., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Defect detectability analysis via Probability of defect detection between traditional and deep learning methods in numerical simulations”, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.PDF icon Download paper (2.37 MB)
N. Francken, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Enhancing industrial inspection with efficient edge illumination x-ray phase contrast simulations”, in IEEE EUROCON 2023 -20th International Conference on Smart Technologies, Torino, Italy, 2023.PDF icon eurocon_2023.pdf (8.52 MB)
B. Koirala, Rasti, B., Bnoulkacem, Z., Ribeiro, A. De Lima, Madriz, Y., Herrmann, E., Gestels, A., De Kerf, T., Lorenz, S., Fuchs, M., Janssens, K., Steenackers, G., Gloaguen, R., and Scheunders, P., “A Multisensor Hyperspectral Benchmark Dataset For Unmixing of Intimate Mixtures”, IEEE Sensors Journal, 2023.PDF icon a_multisensor_hyperspectral_benchmark_dataset_for_unmixing_of_intimate_mixtures_1_.pdf (22.13 MB)
D. Frenkel, Six, N., De Beenhouwer, J., and Sijbers, J., “Tabu-DART: A dynamic update strategy for efficient discrete algebraic reconstruction”, The Visual Computer, vol. 39, pp. 4671–4683, 2023.PDF icon Download paper (2.31 MB)
2022
Y. - T. Ling, Cools, S., Bogdanowicz, J., Fleischmann, C., De Beenhouwer, J., Sijbers, J., and Vandervorst, W., “A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography”, Microscopy and Microanalysis, vol. 28, no. 4, pp. 1-14, 2022.
T. Elberfeld, Fröhler, B., Heinzl, C., Sijbers, J., and De Beenhouwer, J., “cuPARE: Parametric Reconstruction of Curved Fibres from Glass fibre-reinforced Composites”, Nondestructive Testing and Evaluation, 2022.PDF icon Download paper (9.66 MB)
N. Francken, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge Illumination Phase Contrast Simulations Using the OptiX GPU Ray Tracing Engine”, 5th International Conference on Tomography of Materials & Structures (ICTMS). 2022.
M. Yosifov, Reiter, M., Heupl, S., Gusenbauer, C., Fröhler, B., R. Gutierrez, F. -, De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Probability of Detection applied to X-ray inspection using numerical simulations”, Nondestructive Testing and Evaluation, vol. 37, no. 5, pp. 536-551, 2022.
Y. Huybrechts, De Ridder, R., De Samber, B., Boudin, E., Tonelli, F., Knapen, D., Schepers, D., De Beenhouwer, J., Sijbers, J., Forlino, A., Coucke, P., P. Witten, E., Kwon, R., Willaert, A., Hendrickx, G., and Van Hul, W., “The sqstm1tmΔUBA zebrafish model, a proof-of-concept in vivo model for Paget’s disease of bone?”, Bone Reports, vol. 16, no. 101483, pp. 75-76, 2022.
2021
S. Hosseinnejad, Bosch, E. G. T., Kohr, H., Lazić, I., Zharinov, V., Franken, E., Sijbers, J., and De Beenhouwer, J., “3D atomic resolution tomography from iDPC-STEM images using multiple atom model prior”, Microscopy Conference. 2021.PDF icon Download abstract (534.35 KB)
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.

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