Publications

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Conference Paper
K. J. Batenburg, Palenstijn, W. J., and Sijbers, J., 3D imaging of semiconductor components by discrete laminography, in Stress induced phenomena and reliability in 3D microelectronics: AIP Conference Proceedings, 2014, vol. 1601, pp. 168-179.PDF icon Download paper (1.81 MB)
W. J. Palenstijn, Batenburg, K. J., and Sijbers, J., The ASTRA Tomography Toolbox, in 13th International Conference on Computational and Mathematical Methods in Science and Engineering, CMMSE 2013, 2013, vol. 4, pp. 1139-1145.PDF icon cmmse2013.pdf (174.19 KB)
G. Ramos-Llordén, Segers, H., Palenstijn, W. J., den Dekker, A. J., and Sijbers, J., Partially discrete magnetic resonance tomography, in 2015 IEEE International Conference on Image Processing (ICIP), 2015, pp. 1653-1657.
K. J. Batenburg, Palenstijn, W. J., and Sijbers, J., Projection and backprojection in tomography: design choices and considerations, in Workshop on Applications of Discrete Geometry and Mathematical Morphology, 2010, pp. 106-110.PDF icon Download paper (367.34 KB)
L. Plantagie, Palenstijn, W. J., Sijbers, J., and Batenburg, K. J., Spatial Variations in Reconstruction Methods for CT, in The Second International Conference on Image Formation in X-Ray Computed Tomography (CT Meeting), 2012, pp. 170-173.
J. Cant, Palenstijn, W. J., Behiels, G., and Sijbers, J., Tomographic image reconstruction from continuous projections, in The third international conference on image formation in X-ray computed tomography, Salt Lake City, USA, 2014, pp. 295-298.PDF icon Download paper (2.38 MB)
Journal Article
P. Reischig, King, A., Nervo, L., Viganó, N., Guilhem, Y., Palenstijn, W. J., Batenburg, K. J., Preuss, M., and Ludwig, W., Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials, Journal of Applied Crystallography, vol. 46, no. 2, pp. 297 - 311, 2013.
W. Van Aarle, Palenstijn, W. J., De Beenhouwer, J., Altantzis, T., Bals, S., Batenburg, K. J., and Sijbers, J., The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography, Ultramicroscopy, vol. 157, pp. 35–47, 2015.PDF icon Download paper (3.47 MB)
H. Segers, Palenstijn, W. J., Batenburg, K. J., and Sijbers, J., Discrete Tomography in MRI: a Simulation Study, Fundamenta Informaticae, vol. 125, no. 3-4, pp. 223-237, 2013.
W. J. Palenstijn, Bédorf, J., Sijbers, J., and Batenburg, K. J., A distributed ASTRA Toolbox, Advanced Structural and Chemical Imaging, vol. 2, no. 19, 2016.PDF icon Download paper (2.7 MB)
K. J. Batenburg, Palenstijn, W. J., Balazs, P., and Sijbers, J., Dynamic angle selection in binary tomography, Computer Vision and Image Understanding, vol. 117, no. 5, pp. 306–318, 2013.PDF icon Download paper (2.71 MB)
F. Bleichrodt, van Leeuwen, T., Palenstijn, W. J., Van Aarle, W., Sijbers, J., and Batenburg, K. J., Easy implementation of advanced tomography algorithms using the ASTRA toolbox with Spot operators, Numerical Algorithms, vol. 71, pp. 673-697, 2016.
W. Van Aarle, Palenstijn, W. J., Cant, J., Janssens, E., Bleichrodt, F., Dabravolski, A., De Beenhouwer, J., Batenburg, K. J., and Sijbers, J., Fast and Flexible X-ray Tomography Using the ASTRA Toolbox, Optics Express, vol. 24, pp. 25129-25147, 2016.PDF icon Download paper (8.34 MB)
D. Pelt, Gursoy, D., Palenstijn, W. J., Sijbers, J., De Carlo, F., and Batenburg, K. J., Integration of TomoPy and the ASTRA toolbox for advanced processing and reconstruction of tomographic synchrotron data, Journal of Synchrotron Radiation, vol. 23, pp. 842-849, 2016.
J. Cant, Palenstijn, W. J., Behiels, G., and Sijbers, J., Modeling blurring effects due to continuous gantry rotation: application to region of interest tomography, Medical Physics, vol. 42, no. 5, pp. 2709-2717, 2015.
W. J. Palenstijn, Batenburg, K. J., and Sijbers, J., Performance improvements for iterative electron tomography reconstruction using graphics processing units (GPUs), Journal of structural biology, vol. 176, no. 2, pp. 250-253, 2011.PDF icon Download paper (527.21 KB)
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., de Nijs, B., van Huis, M. A., Sánchez-Iglesias, A., Liz-Marzán, L. M., van Blaaderen, A., Batenburg, K. J., Bals, S., and Van Tendeloo, G., Quantitative 3D analysis of huge nanoparticle assemblies., Nanoscale, vol. 8, no. 1, pp. 292-9, 2016.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., van Nijs, B., van Huis, M. A., van Blaaderen, A., Sánchez-Iglesias, A., Liz-Marzán, L. M., Batenburg, K. J., Bals, S., and Van Tendeloo, G., Quantitative 3D analysis of huge nanoparticle assemblies, Nanoscale, vol. 8, no. 1, pp. 292-299, 2015.
B. de Smit, McClure, M., Palenstijn, W. J., Sparling, I. E., and Wagon, S., Through the Looking-Glass, and What the Quadratic Camera Found There, The Mathematical Intelligencer, vol. 34, no. 3, pp. 30 - 34, 2012.