Publications

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Author Type [ Year(Asc)]
In Press
R. Heylen, Thanki, A., Verhees, D., Iuso, D., De Beenhouwer, J., Sijbers, J., Witvrouw, A., Haitjema, H., and Bey-Temsamani, A., “3D total variation denoising in X-CT imaging applied to pore extraction in additively manufactured parts”, Measurement Science and Technology, In Press.
2022
A. - T. Nguyen, Renders, J., Soete, J., Wevers, M., Sijbers, J., and De Beenhouwer, J., “Analytic derivatives of scaling-compensated projection operators for dynamic computed tomography”, in 11th Conference on Industrial Computed Tomography, 2022.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “CNN-based pose estimation from a single X-ray projection for 3D inspection of manufactured objects”, in 11th Conference on Industrial Computed Tomography, 2022.
J. Christopher, Lumbeeck, L. - P., Paramonov, P., De Beenhouwer, J., and Sijbers, J., “Discrete Terahertz tomography: a simulation study ”, in 11th Conference on Industrial Computed Tomography, 2022.
T. De Kerf, Pipintakos, G., Zahiri, Z., Vanlanduit, S., and Scheunders, P., “Identification of corrosion minerals usning shortwave infrared hyperspectral imaging”, Sensors, vol. 22, no. 1, p. 407, 2022.
B. Rasti, Koirala, B., Scheunders, P., and Ghamisi, P., “UnDIP: hyperspectral unmixing using deep image prior”, IEEE Transactions on Geoscience and Remote Sensing, vol. 60, pp. 1-15, 2022.
K. Rafiezadeh Sahi, Ghamisi, P., Rasti, B., Scheunders, P., and Gloaguen, R., “Unsupervised Data Fusion with Deeper Perspective: A Novel Multi-Sensor Deep Clustering Algorithm”, IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing , vol. 15, pp. 284-296, 2022.
2021
J. Van Houtte, Gao, X., Sijbers, J., and Zheng, G., “2D/3D registration with a statistical deformation model prior using deep learning”, in the IEEE International Conference on Biomedical and Health Informatics (BHI'21) , 2021.PDF icon Download paper (1.41 MB)
S. Hosseinnejad, Bosch, E. G. T., Kohr, H., Lazić, I., Zharinov, V., Franken, E., Sijbers, J., and De Beenhouwer, J., “3D atomic resolution tomography from iDPC-STEM images using multiple atom model prior”, Microscopy Conference. 2021.PDF icon Download abstract (534.35 KB)
L. - P. Lumbeeck, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “3D THz Tomography Incorporating the Beam Shape”, in 2021 OSA Imaging and Applied Optics Congress, 2021.
B. Shafieizargar, Jeurissen, B., Poot, D. H. J., Van Audekerke, J., Verhoye, M., den Dekker, A. J., and Sijbers, J., “Accelerated multi-shot diffusion weighted imaging with joint estimation of diffusion and phase parameters”, Magn Reson Mater Phy, vol. 34. pp. S57-S58, 2021.
M. Naeyaert, Aelterman, J., Golkov, V., Cremers, D., Pizurica, A., Sijbers, J., and Verhoye, M., “Accelerating in vivo fast spin echo high angular resolution diffusion imaging with an isotropic resolution in mice through compressed sensing”, Magnetic Resonance in Medicine, vol. 85, no. 3, pp. 1397-1413, 2021.
J. Renders, Sijbers, J., and De Beenhouwer, J., “Adjoint image warping using multivariate splines with application to 4D-CT”, Medical Physics, vol. 48, no. 10, pp. 6362-6374, 2021.PDF icon Download paper (6.28 MB)
B. Huyge, Sanctorum, J., Six, N., De Beenhouwer, J., and Sijbers, J., “Analysis of flat fields in edge illumination phase contrast imaging”, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 1310-1313.
H. R. P. Park, Verhelst, H., Quak, M., Jeurissen, B., and Krebs, R. M., “Associations between different white matter properties and reward-based performance modulation”, Brain Structure and Function, 2021.
D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “CNN-based Pose Estimation of Manufactured Objects During Inline X-ray Inspection”, in 2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI), 2021.

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