Publications

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2024
D. Iuso, “Ensuring Flawlessness in Additive Manufacturing: Advances in X-ray Inspection Techniques for Efficient Defect Detection”, 2024.PDF icon Download thesis (31.17 MB)
J. Merckx, den Dekker, A. J., De Beenhouwer, J., and Sijbers, J., “Fast and efficient tetrahedral volume mesh reconstruction with CAD-ASTRA”, in SPIE Developments in X-Ray Tomography XV, San Diego, USA, 2024, vol. 13152.PDF icon fast_and_efficient_tetrahedral_volume_mesh_reconstruction_with_cad_astra.pdf (575.43 KB)
P. Paramonov, Sanctorum, J. G., Iuso, D., Sijbers, J., and De Beenhouwer, J., “High-resolution tiled X-ray cone-beam CT using the ASTRA toolbox”, in 13th Conference on Industrial Computed Tomography (iCT) 2024, School of Engineering, Wels Campus, Austria, 2024.PDF icon Download paper (532.89 KB)
J. Deng, Renders, J., Meenaketan, B. Linkoon P., Takalloo, S. Ebrahimi, Braeken, D., De Beenhouwer, J., and Sijbers, J., “Imaging Algorithm and Optimal Measurement Protocol for 3D Impedance Tomography on 2D High Density Micro Electrode Array”, IEEE Sensors, vol. 24, no. 15, pp. 24452-24465, 2024.
J. Renders, “Improved 4DCT reconstruction algorithms for the imaging of foam microstructure formation”, 2024.PDF icon Download thesis (41.42 MB)
N. Six, “Improved X-ray CT reconstruction techniques with non-linear imaging models”, 2024.
N. Francken, De Beenhouwer, J., and Sijbers, J., “Inline edge illumination through sample mask misalignment: a proof of concept”, in Proceedings of the 6th International Conference on X-ray and Neutron Phase Imaging with Gratings, Shenzhen, China, 2024.PDF icon inline_edge_misalign_xnpig.pdf (209.25 KB)
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., “Inline edge illumination X-ray phase contrast imaging through mask misalignment”, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
N. Six, Renders, J., De Beenhouwer, J., and Sijbers, J., “Joint multi-contrast CT for edge illumination X-ray phase contrast imaging using split Barzilai-Borwein steps”, Optics Express, vol. 32, no. 2, pp. 1135-1150, 2024.PDF icon Download paper (13.42 MB)
J. De Beenhouwer, Sijbers, J., and Vanthienen, P. - J., “Mask assembly for edge illumination phase contrast radiation imaging”, U.S. Patent EP2025062978W2024.PDF icon mask_patent.pdf (6.93 MB)
P. - J. Vanthienen, Francken, N., Sijbers, J., and De Beenhouwer, J., “Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study”, in Developments in X-Ray Tomography XV, 2024, vol. 13152, p. 1315208.
D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., “PACS: Projection-driven with Adaptive CADs X-ray Scatter compensation for additive manufacturing inspection”, Precision Engineering, vol. 90, pp. 108-121, 2024.PDF icon Download paper (4.28 MB)
D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., “Practical multi-mesh registration for few-view poly-chromatic X-ray inspection”, Journal of Non-destructive Testing, vol. 43, 2024.PDF icon Download paper (6.94 MB)
A. - T. Nguyen, Renders, J., Sijbers, J., and De Beenhouwer, J., “Reconstruction with rigid motion correction technique in CT imaging: A simulation and application study”, Workshop on Scientific Computing and Applications. Vietnam Institute for Advanced Study in Mathematics (VIASM), Hanoi, Vietnam, 2024.PDF icon wsca2024.pdf (110.08 KB)PDF icon wsca2024_slides.pdf (2.75 MB)
J. Lüken, Fleischmann, C., Sijbers, J., and De Beenhouwer, J., “Simulating Atom Probe Tomography Using MFEM”, MFEM Community Workshop. 2024.
P. - J. Vanthienen, Sijbers, J., and De Beenhouwer, J., “A simulation study of optimized-aperture gratings for edge illumination cone-beam phase contrast x-ray imaging”, in Proceedings of the 6th International Conference on X-ray and Neutron Phase Imaging with Gratings, Shenzhen, China, 2024.Microsoft Office document icon proceeding_xnpig_pjvanthienen (165.5 KB)
D. Iuso, Chatterjee, S., Cornelissen, S., Verhees, D., De Beenhouwer, J., and Sijbers, J., “Voxel-wise segmentation for porosity investigation of additive manufactured parts with 3D unsupervised and (deeply) supervised neural models”, Applied Intelligence, vol. 54, pp. 13160–13177, 2024.PDF icon Download paper (2.48 MB)
B. Huyge, Renders, J., De Beenhouwer, J., and Sijbers, J., “X-ray image reconstruction for continuous acquisition with accelerated rotation”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
B. Huyge, Renders, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., “X-ray image reconstruction for continuous acquisitions with a generalized motion model”, Optics Express, vol. 32, no. 22, pp. 39192-39207, 2024.
2025
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Correcting for focal spot drift in edge illumination X-ray phase contrast imaging”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.
J. Merckx, den Dekker, A. J., Sijbers, J., and De Beenhouwer, J., “DAMMER: Direct Adaptive Multi-resolution MEsh Reconstruction from X-ray measurements”, IEEE Transactions on Computational Imaging , vol. 11, pp. 926 - 941, 2025.
M. Yosifov, Lang, T., Florian, V., Gerth, S., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Degradation Detection in Rice Products via Shape Variations in XCT Simulation-Empowered AI”, Journal of Nondestructive Evaluation, vol. 44, no. 10, 2025.
N. Francken, “Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions”, 2025.
B. Huyge, Francken, N., Sanctorum, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., “Edge illumination X-ray phase contrast imaging with continuous mask motion”, Optics Express, vol. 33, no. 19, pp. 41271-41286, 2025.PDF icon Download paper (4.78 MB)
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Efficient X-ray dark field contrast simulations using a condensed history approach”, Optics Express, vol. 33, no. 2, pp. 3562-3576, 2025.

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