Publications

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Conference Paper
B. Huyge, Jeurissen, B., De Beenhouwer, J., and Sijbers, J., “Fiber orientation estimation by constrained spherical deconvolution of the anisotropic edge illumination x-ray dark field signal”, in SPIE: Developments in X-Ray Tomography XIV, 2022, vol. 12242, p. 122420V .PDF icon Download paper (956.82 KB)
T. Elberfeld, De Beenhouwer, J., and Sijbers, J., “Fiber assignment by continuous tracking for parametric fiber reinforced polymer reconstruction”, in 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully3D), 2019, vol. 11072.PDF icon Download paper (5.15 MB)
E. Janssens, Senck, S., Heinzl, C., Kastner, J., De Beenhouwer, J., and Sijbers, J., “Fast Reconstruction of CFRP X-ray Images based on a Neural Network Filtered Backprojection Approach”, in 7th Conference on Industrial Computed Tomography, Leuven, Belgium, 2017.PDF icon Download paper (345.06 KB)
E. Janssens, Sijbers, J., Dierick, M., and De Beenhouwer, J., “Fast detection of cracks in ultrasonically welded parts by inline X-ray inspection”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019.
L. F. Alves Pereira, De Beenhouwer, J., Kastner, J., and Sijbers, J., “Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks”, in ICTAI 2020, 2020.PDF icon Download paper (2.5 MB)
D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., “Evaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122421K.PDF icon Download paper (protected) (1.79 MB)
N. Francken, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Enhancing industrial inspection with efficient edge illumination x-ray phase contrast simulations”, in IEEE EUROCON 2023 -20th International Conference on Smart Technologies, Torino, Italy, 2023.PDF icon eurocon_2023.pdf (8.52 MB)
P. Paramonov, Renders, J., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., “Efficient X-ray projection of triangular meshes based on ray tracing and rasterization”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122420W .PDF icon Download paper (1.72 MB)
Á. Marinovszki, De Beenhouwer, J., and Sijbers, J., “An efficient CAD projector for X-ray projection based 3D inspection with the ASTRA Toolbox”, in 8th Conference on Industrial Computed Tomography, Wels, Austria, 2018.PDF icon Download paper (364.16 KB)
G. Van Eyndhoven, De Beenhouwer, J., and Sijbers, J., “A dynamic region estimation method for cerebral perfusion CT”, in 6th International Conference on Optical Measurement Techniques for Structures and Systems (OPTIMESS), 2016, pp. 331-342.PDF icon Download paper (840.01 KB)
V. Van Nieuwenhove, De Beenhouwer, J., and Sijbers, J., “Dynamic flat field correction in X-ray computed tomography”, in Optimess conference, 2016, Antwerp.
A. Presenti, Sijbers, J., and De Beenhouwer, J., “Dynamic angle selection for few-view X-ray inspection of CAD based objects”, in Proc. SPIE, 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine (Fully3D), 2019, vol. 11072.
W. Van Aarle, Cant, J., De Beenhouwer, J., and Sijbers, J., “Discrete tomographic reconstruction from deliberately motion blurred X-ray projections”, in 6th Conference on Industrial Computed Tomography, Wels, Austria, 2016, pp. 1-6.PDF icon Download paper (444.66 KB)
J. Renders, Shafieizargar, B., Verhoye, M., De Beenhouwer, J., den Dekker, A. J., and Sijbers, J., “DELTA-MRI: Direct deformation Estimation from LongiTudinally Acquired k-space data”, in IEEE International Symposium on Biomedical Imaging, 2023, pp. 1-4.
L. F. Alves Pereira, De Beenhouwer, J., and Sijbers, J., “The Deep Steerable Convolutional Framelet Network for Suppressing Directional Artifacts in X-ray Tomosynthesis”, in 31st European Signal Processing Conference, EUSIPCO, 2023.
A. Presenti, Bazrafkan, S., Sijbers, J., and De Beenhouwer, J., “Deep learning-based 2D-3D sample pose estimation for X-ray 3DCT”, in 10th Conference on Industrial Computed Tomography (ICT 2020), 2020.
L. F. Alves Pereira, Van Nieuwenhove, V., De Beenhouwer, J., and Sijbers, J., “A Deep Convolutional Framelet Network based on Tight Steerable Wavelet: application to sparse-view medical tomosynthesis”, in International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, 2021.
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Dark field sensitivity in single mask edge illumination lung imaging”, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 775-778.
N. Francken, Sanctorum, J., Renders, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “A condensed history approach to x-ray dark field effects in edge illumination phase contrast simulations”, in 45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2023.PDF icon Download paper (4.14 MB)
J. Weissenböck, Arikan, M., Salaberger, D., Kastner, J., De Beenhouwer, J., Sijbers, J., Rauchenzauner, S., Raab-Wernig, T., Gröller, E., and Heinzl, C., “Comparative Visualization of Orientation Tensors in Fiber-Reinforced Polymers”, in 8th Conference on Industrial Computed Tomography, Wels, Austria , 2018.PDF icon Download paper (1.03 MB)
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “CNN-based Pose Estimation of Manufactured Objects During Inline X-ray Inspection”, in 2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI), 2021.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “CNN-based pose estimation from a single X-ray projection for 3D inspection of manufactured objects”, in 11th Conference on Industrial Computed Tomography, 2022.
M. Ljubenović, Bazrafkan, S., De Beenhouwer, J., and Sijbers, J., “CNN-based Deblurring of Terahertz Images”, in Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISAPP), 2020, vol. 4, pp. 323-330.PDF icon Download paper (16.31 MB)
D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021, pp. 2948-2952.
A. Presenti, Sijbers, J., den Dekker, A. J., and De Beenhouwer, J., “CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images”, in 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019, pp. 1-5.PDF icon ict2019_full_paper_55.pdf (216.2 KB)

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