Publications

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2015
W. Van Aarle, W J. Palenstijn, J. De Beenhouwer, T. Altantzis, S. Bals, K. J. Batenburg, and J. Sijbers, "The ASTRA Toolbox: a platform for advanced algorithm development in electron tomography", Ultramicroscopy, vol. 157, pp. 35–47, 2015. PDF icon Download paper (1.4 MB)
V. Van Nieuwenhove, J. De Beenhouwer, F. De Carlo, L. Mancini, F. Marone, and J. Sijbers, "Dynamic intensity normalization using eigen flat fields in X-ray imaging", Optics Express, vol. 23, issue 21, pp. 27975-27989, 2015. Package icon Download Matlab code (2.92 MB)PDF icon Download paper (1.68 MB)
V. Van Nieuwenhove, J. De Beenhouwer, and J. Sijbers, "A fast 4D CT reconstruction algorithm for affine deforming objects", Applied inverse problems conference, Helsinki, 2015.
E. Janssens, D. Pelt, J. De Beenhouwer, M. Van Dael, P. Verboven, B. Nicolai, and J. Sijbers, "Fast Neural Network Based X-Ray Tomography of Fruit on a Conveyor Belt", Chemical Engineering Transactions, vol. 44, Milano, Italy, pp. 181-186, 2015.
B. Goris, J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-Iglesias, L. M. Liz-Marzán, S. Van Aert, S. Bals, J. Sijbers, et al., "Measuring Lattice Strain in Three Dimensions through Electron Microscopy", Nano Letters, vol. 15, issue 10, pp. 6996–7001, 2015.
E. Janssens, J. De Beenhouwer, M. Van Dael, P. Verboven, B. Nicolai, and J. Sijbers, "Neural Network Based X-Ray Tomography for Fast Inspection of Apples on a Conveyor Belt", IEEE International Conference on Image Processing, pp. 917-921, Sept 21-27, 2015.
2013
F. Bleichrodt, J. De Beenhouwer, J. Sijbers, and K. J. Batenburg, "An Alignment Method for Fan Beam Tomography", International Conference on Tomography of Materials and Structures (ICTMS), pp. 103-107, 2013.

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