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Fröhler, B., T. Elberfeld, T. Möller, J. Weissenböck, J. De Beenhouwer, J. Sijbers, H-C. Hege, J. Kastner, and C. Heinzl, "A Visual Tool for the Analysis of Algorithms for Tomographic Fiber Reconstruction in Materials Science", Computer Graphics Forum, vol. 38, issue 3, pp. 273-283, 2019.
Fröhler, B., L. da Cunha Melo, J. Weissenböck, J. Kastner, T. Möller, H-C. Hege, E. Gröller, J. Sanctorum, J. De Beenhouwer, J. Sijbers, et al., "Tools for the Analysis of Datasets from X-Ray Computed Tomography based on Talbot-Lau Grating Interferometry", 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019. PDF icon Download paper (1.07 MB)
Froeling, M., G.. J. Strijkers, B. Jeurissen, M. van der Paardt, J. Stoker, K. Nicolay, A. J. Nederveen, and A. Leemans, "Fiber architecture of the female pelvic floor: An exploratory investigation using different diffusion MRI tractography algorithms", ISMRM, 19th Scientific Meeting and Exhibition, Montreal, Canada, May, 2011.
Fransen, E., R. Dhooghe, G. Van Camp, M. Verhoye, J. Sijbers, E. Reyniers, P. Soriano, H. Kamiguchi, R. Willemsen, K. E. Koekoek, et al., "L1 knockout mice show dilated ventricles, vermis hypoplasia and impaired exploration patterns", Human Molecular Genetics, vol. 7, no. 6, pp. 999-1009, 1998. PDF icon Download paper (248.02 KB)
Fortes, W., J. Sijbers, and K. J. Batenburg, "Practical Error Bounds for Binary Tomography", 1st International Conference on Tomography of Materials and Structures, pp. 97-100, 2013. PDF icon Download paper (165.74 KB)
Forde, N. J., C. Scanlon, L. Emsell, S. O'Donoghue, C. Chaddock, A. Leemans, B. Jeurissen, D. M. Cannon, R. M. Murray, and C. McDonald, "Structural brain network analysis in families multiply affected with bipolar 1 disorder", International Review of Psychosis & Bipolarity, Athens, Greece, 2014.
Forde, N. J., I. Ellison-Wright, P. J. Nathan, R. Zaman, R. Dudas, M. Agius, E. Fernandez-Egea, A. Leemans, B. Jeurissen, C. Scanlon, et al., "White Matter Tract Deficits in Schizophrenia", Neuroscience Ireland Conference, vol. 7, Dublin, Ireland, 2011.
Forde, N. J., L. Ronan, J. Suckling, C. Scanlon, S. Neary, L. Holleran, A. Leemans, R. Tait, C. Rua, P. C. Fletcher, et al., "Structural neuroimaging correlates of allelic variation of the BDNF val66met polymorphism.", NeuroImage, vol. 90, pp. 280-9, 2014 Apr 15.
Forde, N. J., S. O'Donoghue, C. Scanlon, L. Emsell, C. Chaddock, A. Leemans, B. Jeurissen, G. J. Barker, D. M. Cannon, R. M. Murray, et al., "Structural brain network analysis in families multiply affected with bipolar I disorder", Psychiatry Research: Neuroimaging, vol. 234, no. 1: Elsevier, pp. 44–51, 2015.
Fillard, P., M. Descoteaux, A. Goh, S. Gouttard, B. Jeurissen, J. Malcolm, A. Ramirez-Manzanares, M. Reisert, K. Sakaie, F. Tensaouti, et al., "Quantitative Evaluation of 10 Tractography Algorithms on a Realistic Diffusion MR Phantom", NeuroImage, vol. 56, no. 1, pp. 220-234, May, 2011.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection", SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, 2018.
Fatermans, J., S. Van Aert, and A J. den Dekker, "The maximum a posteriori probability rule for atom column detection from HAADF STEM images", Ultramicroscopy, vol. 201, pp. 81-91, 2019.
Fatermans, J., K. Müller-Caspary, A J. den Dekker, and S. Van Aert, "Detection of atomic columns from noisy STEM images", MC 2017, Lausanne, Switzerland, 2017.
Fatermans, J., S. Van Aert, and A J. den Dekker, "Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images", RBSM 2016, Brussels, Belgium, 2016.
Fatermans, J., A J. den Dekker, K.. Müller-Caspary, I. Lobato, C.. M. O'Leary, P. D. Nellist, and S. Van Aert, "Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images", Phys. Rev. Lett., vol. 121, pp. 056101, Jul, 2018.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images", IMC19, Sydney, Australia, 2018.