Publications

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2025
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Correcting for focal spot drift in edge illumination X-ray phase contrast imaging”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.
N. Francken, “Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions”, 2025.
B. Huyge, Francken, N., Sanctorum, J., Sanctorum, J., De Beenhouwer, J., and Sijbers, J., “Edge illumination X-ray phase contrast imaging with continuous mask motion”, Optics Express, vol. 33, no. 19, pp. 41271-41286, 2025.PDF icon Download paper (4.78 MB)
N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Efficient X-ray dark field contrast simulations using a condensed history approach”, Optics Express, vol. 33, no. 2, pp. 3562-3576, 2025.
P. - J. Vanthienen, Francken, N., Sanctorum, J., Sijbers, J., and De Beenhouwer, J., “Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation”, Optics Express, vol. 33, no. 8, pp. 17886-17902, 2025.
2024
P. Paramonov, Francken, N., Renders, J., Iuso, D., Elberfeld, T., De Beenhouwer, J., and Sijbers, J., “CAD-ASTRA: A versatile and efficient mesh projector for X-ray tomography with the ASTRA-toolbox”, Optics Express, vol. 32, no. 3, pp. 3425-3439, 2024.PDF icon Download paper (11.29 MB)
D. Gökbel Keklikoğlu, Francken, N., Huyge, B., Merdan, Z., De Beenhouwer, J., and Sijbers, J., “Dynamic flat field correction in edge illumination imaging”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
N. Francken, Sanctorum, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox”, Optics Express, vol. 32, no. 6, pp. 10005-10021, 2024.
N. Francken, Sanctorum, J., Sanctorum, J., Vanthienen, P. - J., Sijbers, J., and De Beenhouwer, J., “Inline edge illumination X-ray phase contrast imaging through mask misalignment”, Optics Express, vol. 32, no. 18, pp. 32048-32061, 2024.PDF icon Download paper (1.69 MB)
P. - J. Vanthienen, Francken, N., Sijbers, J., and De Beenhouwer, J., “Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study”, in Developments in X-Ray Tomography XV, 2024, vol. 13152, p. 1315208.
2023
N. Francken, Sanctorum, J., Renders, J., Paramonov, P., Sijbers, J., and De Beenhouwer, J., “A condensed history approach to x-ray dark field effects in edge illumination phase contrast simulations”, in 45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2023.PDF icon Download paper (4.14 MB)
N. Francken, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Enhancing industrial inspection with efficient edge illumination x-ray phase contrast simulations”, in IEEE EUROCON 2023 -20th International Conference on Smart Technologies, Torino, Italy, 2023.PDF icon eurocon_2023.pdf (8.52 MB)
2022
N. Francken, Paramonov, P., Sijbers, J., and De Beenhouwer, J., “Edge Illumination Phase Contrast Simulations Using the OptiX GPU Ray Tracing Engine”, 5th International Conference on Tomography of Materials & Structures (ICTMS). 2022.