Publications

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Conference Abstract
J. Rimpelainen, Bazrafkan, S., Sijbers, J., and De Beenhouwer, J., “Deep learning based missing wedge artefact removal for electron tomography”, Microscopy Conference, Berlin, Germany. pp. 660-661, 2019.
V. Van Nieuwenhove, Van Eyndhoven, G., De Beenhouwer, J., and Sijbers, J., “Compensation of affine deformations in fan and cone beam projections”, Micro-CT User Meeting. pp. 187-189, 2014.PDF icon Download abstract (285.55 KB)
J. Merckx, van Lith, B., Sijbers, J., and De Beenhouwer, J., “Adaptive triangular mesh for phase contrast imaging”, 5th international Conference on Tomography of Materials & Structures, 27the June - 1ste July, Grenoble, France. 2022.

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